CGPDTM Patent Examiner Admit Card 2024 : Controller General of Patents, Designs and Trade Marks, DPIIT is holding a Recruitment for 553 Posts of Examiner of Patents & Designs. Its Exam Date and Admit Card Download official website is www.ipindia.gov.in OR nta.ac.in. While, On this page We giving complete information about CGPDTM Patent Examiner Vacancy 2023 – 2024 Exam Date, City Information Slip, Syllabus and Admit Card.
CGPDTM Patent Examiner Admit Card 2024 Latest Update
The Mains Written Exam for CGPDTM Patent Examiner Recruitment 2023 will be held on 25th January 2024 By National Testing Agency (NTA). Admit Card for CGPDTM Patent Examiner Mains Exam 2024 likely to release 3-4 days before the exam. Applicants can download their admit card through official website, direct link of which is given below.
|CGPDTM Patent Examiner Recruitment 2023 – 2024 Admit Card
|Controller General of Patents, Designs, and Trade Marks
|Name of Post
|Examiner of Patents & Designs under DR quota in the Patent Office
|Preliminary Exam, Mains Exam and Interview (Pattern and Syllabus has been mentioned in official advertisement)
|Date and Direct Link Given Below
Recruitment Exam Date
- Starting Date to Apply Online : 14th July 2023
- Last Date for Submission of Online Form : 7th August 2023
- City Information Link : 15th December 2023
- Admit Card Release Date : 3-4 Days before the exam
- Prelims Exam Date : 21st December 2023
- Mains Exam Date : 25th January 2024
Official Link for All Updates
- Mains Admit Card – Available Soon
- Prelims Admit Card
- Advance City Information Link
- Notice for City Information Slip
- Exam Date Notice
- Official Website
If You have applied for this recruitment, Then you should keep visiting on the website – www.rsmssbrecruitment.com for upcoming latest update. Because, as soon as any new update announce, we provide same here. Therefore from this page, You can also fetch the CGPDTM Patent Examiner 2024 exam date, admit card, answer key, result, cut off marks and final merit list pdf of this recruitment exam.